ข้อมูลสินค้า
DeFelsko PosiTector RTR Series
Surface Profile Gage for Blasted Steel and Textured Coatings
Digital spring micrometers measure and record surface profile parameters using Testex Press-O-Film™ replica tape.
- Ready to measure – no calibration adjustment required for most applications
- Produces a more accurate peak-to-valley height measurement
- Solvent, acid, oil, water, and dust resistant – weatherproof
- PosiTector interchangeable platform – attach any PosiTector probe to a single gage body
- USB, WiFi, and Bluetooth connectivity to PosiSoft PC, Mac, and Smartphone software
- Certificate of Calibration showing traceability to PTB included (Long Form)
1. Prepare | 2. Burnish | 3. Measure |
▲ Use cleaning putty to remove dust, debris, or residual blast media from the measurement site by firmly pressing the putty onto surface to be tested using your fingers and remove
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Standard Model Feature:
● Monochrome display
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Advanced Model Feature:
● Hi Contrast reversible color LCD
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SmartLink Model Feature:
● Wirelessly connect probes to smart device.
● Lightweight & compact design, uses one AAA battery ● Auto-pairing Bluetooth up to 10 m away. ● Create & save PDF reports quickly & easily. ✱ Compatibled with PosiTector® 6000, SPG, RTR, DPM. |
Step 2: Choose material type
RTRH
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Peak Height (HL) Measurement Range | 20 to 115 µm (0.8 to 4.5 mils) |
Peak height (HL) Accuracy | ±5 µm (+0.2 mils) |
Peak Height (HL) Resolution | ±1 µm (+0.2 mils) |
Anvil Pressure | 110 gram-force (1.1 Newtons) |
Anvil Diameter | ø6.3 mm (ø0.25 inch) |
Dimension / Weight | 152 x 61 x 28 mm / 140 |
RTR3D
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Measuring Range (H) | 20 to 115 µm (0.8 to 4.5 mils) |
Measuring Range (Rt) | 10 to 115 µm (0.4 to 4.5 mils) |
Minimum Roughness (Ra) | 2 µm (0.08 mil / 80 µin) |
Accuracy (H) | ± 5 µm, ± 0.2 mil |
Accuracy (Rt) * | ± (5 µm + 5%), ± (0.2 mil + 5%) |
Accuracy (Ra) * | ± (0.25 µm +5%), ± (0.01 mil +5%) |
Resolution | 0.01 µm, 0.01 mil |
Field of View | 3.8 x 3.8 mm, 0.149 x 0.149 inch |
Vertical Resolution |
100 nm (2D/3D), 10 nm (SDF) 3.93 µin (2D/3D), 0.393 µin (SDF) |
Lateral Sampling | 3.7 µm, 0.145 mil |
Anvil Diameter | ø6.25 mm, ø0.25 inch |
* When measured using Optical Grade X-Coarse Replica Tape